5251產品概述
Test Clip, Gold Plated (Contact) Material
Upper contacts are 0.025 in. sq. pins, spaced at 0.100 in., pins are perfect for sq. pin receptacles, wire-wrap or jumper leads Gold plated lower contacts assure reliable, noise free connections
These new test clips are designed especially for in-circuit testing on small outline integrated circuits (SOIC & SOJ). The SOIC clip test clip assures a positive connection to all chip leads and provides hands-free testing.
Datasheet
