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DE-.8MM-J/J-1.4-.225
DE-.8MM-J/J-1.4-.225 -
SPHERICAL RADIUS TIP ON BOTH ENDS SEMICONDUCTOR PROBE
聲明：圖片僅供參考，請以實(shí)物為準(zhǔn)！
制造商：
Smiths Interconnect Americas, Inc.
Smiths Interconnect Americas, Inc.
制造商產(chǎn)品編號：
DE-.8MM-J/J-1.4-.225
倉庫庫存編號：
70009136
技術(shù)數(shù)據(jù)表：
Datasheet
訂購熱線：
400-900-3095 0755-21000796, QQ:
800152669
, Email:
sales@szcwdz.com
由于產(chǎn)品數(shù)據(jù)庫龐大，部分產(chǎn)品信息可能未能及時(shí)更新，下單前請與銷售人員確認(rèn)好實(shí)時(shí)在庫數(shù)量，謝謝合作！
DE-.8MM-J/J-1.4-.225產(chǎn)品概述
Semiconductor Probe, 3 A Current, 0.026 in. Pitch
0.187 in. signal path length
U tip, both ends
1.1 Oz. force per contact.
DE-.8MM-J/J-1.4-.225產(chǎn)品信息
Bandwidth
2.4 GHz @ -1 dB
Brand/Series
100938 Series
Capacitance
0.10 pF
Centerline, Spacing
0.026 (0.65) In.(mm) In.(mm)
Contact Resistance
70 Milliohms (Max.) Milliohms (Max.)
Current Rating
3 A A
Force, Spring
1.1 Oz. Oz.
Gender
Probe
Impedance
50 Ohms
Inductance
0.9 nH (Self) @ 0.029 in. Pitch
Length, Overall
0.225 In. In.
Material, Barrel
Nickel/Silver
Material, Plating
Gold Plated (Plunger)
Material, Plunger
Beryllium Copper
Material, Spring
Stainless Steel
Minimum Centers
0.026 In.
Primary Type
Probe
Temperature, Operating
-55 to +150 °C
Tip Style
Spherical Radius/Sherical Radius
Type
Semiconductor
關(guān)鍵詞
DE-.8MM-J/J-1.4-.225關(guān)聯(lián)產(chǎn)品
參考圖片
制造商 / 說明 / 型號 / 倉庫庫存編號
PDF
操作
Smiths Interconnect Americas, Inc.
TAPERED CROWN TIP SEMICONDUCTOR PROBE
型號：
DE-.8MM-U/U-1.4-.225
倉庫庫存編號：
70009133
搜索
Smiths Interconnect Americas, Inc.
TAPERED CROWN TIP WITH A SPHERICAL RADIUS BOTTOM SEMICONDUCTOR PROBE
型號：
DE-.8MM-U/J-1.4-.225
倉庫庫存編號：
70009134
搜索
Smiths Interconnect Americas, Inc.
TAPERED CROWN TIP ON TOP WITH A SPEAR POINT BOTTOM TIP SEMICONDUCTOR PROBE
型號：
100938-020
倉庫庫存編號：
70009135
搜索
DE-.8MM-J/J-1.4-.225客戶還搜索了
參考圖片
制造商 / 說明 / 型號 / 倉庫庫存編號
PDF
操作
Smiths Interconnect Americas, Inc.
TAPERED CROWN TIP WITH A SPHERICAL RADIUS BOTTOM SEMICONDUCTOR PROBE
型號：
DE-.8MM-U/J-1.4-.225
倉庫庫存編號：
70009134
搜索
Keystone Electronics
Screw; Captive Panel; Knurled Slotted Head; 4-40 Thread; .500 L; .320 OD; SS
型號：
8707
倉庫庫存編號：
70183232
搜索
DE-.8MM-J/J-1.4-.225相關(guān)搜索
Bandwidth 2.4 GHz @ -1 dB
Smiths Interconnect Americas, Inc. Bandwidth 2.4 GHz @ -1 dB
Spring Test Probes Bandwidth 2.4 GHz @ -1 dB
Smiths Interconnect Americas, Inc. Spring Test Probes Bandwidth 2.4 GHz @ -1 dB
Brand/Series 100938 Series
Smiths Interconnect Americas, Inc. Brand/Series 100938 Series
Spring Test Probes Brand/Series 100938 Series
Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series 100938 Series
Capacitance 0.10 pF
Smiths Interconnect Americas, Inc. Capacitance 0.10 pF
Spring Test Probes Capacitance 0.10 pF
Smiths Interconnect Americas, Inc. Spring Test Probes Capacitance 0.10 pF
Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Smiths Interconnect Americas, Inc. Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)
Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Smiths Interconnect Americas, Inc. Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)
Current Rating 3 A A
Smiths Interconnect Americas, Inc. Current Rating 3 A A
Spring Test Probes Current Rating 3 A A
Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 3 A A
Force, Spring 1.1 Oz. Oz.
Smiths Interconnect Americas, Inc. Force, Spring 1.1 Oz. Oz.
Spring Test Probes Force, Spring 1.1 Oz. Oz.
Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 1.1 Oz. Oz.
Gender Probe
Smiths Interconnect Americas, Inc. Gender Probe
Spring Test Probes Gender Probe
Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe
Impedance 50 Ohms
Smiths Interconnect Americas, Inc. Impedance 50 Ohms
Spring Test Probes Impedance 50 Ohms
Smiths Interconnect Americas, Inc. Spring Test Probes Impedance 50 Ohms
Inductance 0.9 nH (Self) @ 0.029 in. Pitch
Smiths Interconnect Americas, Inc. Inductance 0.9 nH (Self) @ 0.029 in. Pitch
Spring Test Probes Inductance 0.9 nH (Self) @ 0.029 in. Pitch
Smiths Interconnect Americas, Inc. Spring Test Probes Inductance 0.9 nH (Self) @ 0.029 in. Pitch
Length, Overall 0.225 In. In.
Smiths Interconnect Americas, Inc. Length, Overall 0.225 In. In.
Spring Test Probes Length, Overall 0.225 In. In.
Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.225 In. In.
Material, Barrel Nickel/Silver
Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver
Spring Test Probes Material, Barrel Nickel/Silver
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver
Material, Plating Gold Plated (Plunger)
Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)
Spring Test Probes Material, Plating Gold Plated (Plunger)
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)
Material, Plunger Beryllium Copper
Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper
Spring Test Probes Material, Plunger Beryllium Copper
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper
Material, Spring Stainless Steel
Smiths Interconnect Americas, Inc. Material, Spring Stainless Steel
Spring Test Probes Material, Spring Stainless Steel
Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Stainless Steel
Minimum Centers 0.026 In.
Smiths Interconnect Americas, Inc. Minimum Centers 0.026 In.
Spring Test Probes Minimum Centers 0.026 In.
Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.026 In.
Primary Type Probe
Smiths Interconnect Americas, Inc. Primary Type Probe
Spring Test Probes Primary Type Probe
Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe
Temperature, Operating -55 to +150 °C
Smiths Interconnect Americas, Inc. Temperature, Operating -55 to +150 °C
Spring Test Probes Temperature, Operating -55 to +150 °C
Smiths Interconnect Americas, Inc. Spring Test Probes Temperature, Operating -55 to +150 °C
Tip Style Spherical Radius/Sherical Radius
Smiths Interconnect Americas, Inc. Tip Style Spherical Radius/Sherical Radius
Spring Test Probes Tip Style Spherical Radius/Sherical Radius
Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style Spherical Radius/Sherical Radius
Type Semiconductor
Smiths Interconnect Americas, Inc. Type Semiconductor
Spring Test Probes Type Semiconductor
Smiths Interconnect Americas, Inc. Spring Test Probes Type Semiconductor
郵箱：
sales@szcwdz.com
Q Q：
800152669
手機(jī)網(wǎng)站：
m.szcwdz.com
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